YUROV, V.M.. Thickness of the surface layer of porous silicon. Recent Contributions to Physics (Rec.Contr.Phys.), [S.l.], v. 72, n. 1, p. 60-66, mar. 2020. ISSN 2663-2276. Available at: <https://bph.kaznu.kz/index.php/zhuzhu/article/view/1231>. Date accessed: 12 july 2020. doi: https://doi.org/10.26577/RCRh.2020.v72.i1.07.