YUROV, V. Thickness of the surface layer of porous silicon. Recent Contributions to Physics, [S. l.], v. 2020, n. 1, p. 60–66, 2020. DOI: 10.26577/RCRh.2020.v72.i1.07. Disponível em: https://bph.kaznu.kz/index.php/zhuzhu/article/view/1231. Acesso em: 9 feb. 2026.