AIMAGANBETOV, K.; TOKMOLDIN, N. Study of deep level parameters in a silicon diode using capacity-based deep level transient spectroscopy. Recent Contributions to Physics, [S. l.], v. 62, n. 3, p. 100–105, 2017. Disponível em: https://bph.kaznu.kz/index.php/zhuzhu/article/view/571. Acesso em: 12 apr. 2026.