An Analytical Evaluation of Semiconductor Resistance Changes in Weak Magnetic Fields

Adem Akkus

doi:10.26577/RCPh2025954

Authors

Adem Akkus Gaziosmanpaşa University, Tokat, Turkey https://orcid.org/0009-0007-2638-7433

DOI:

https://doi.org/10.26577/RCPh2025954

49 11

Keywords:

Magnetic field;, semiconductors;, resistivity;, Fermi-Dirac distribution functions, chemical potential, chemical potential

Abstract

Variations in electrical resistance under the influence of magnetic fields play a crucial role in numerous technological applications, including hard disk drives and microcircuit sensors. In this study, the change in the electrical resistance of a semiconductor exposed to a weak magnetic field is examined within a generalized theoretical framework. The analysis is carried out by formulating the system using single-parameter Fermi–Dirac distribution functions. For all calculations, an analytical expression for these functions, proposed by one of the authors, is employed. A comparison between the analytical results and those obtained through numerical methods demonstrates a high degree of agreement, confirming the reliability and accuracy of the proposed formulation. The analytically derived results are presented in tabular form to enhance clarity and facilitate direct comparison.

Author Biography

Adem Akkus, Gaziosmanpaşa University, Tokat, Turkey

PhD, Department of Physics, Gaziosmanpaşa University, Tokat, Turkiye, e-mail: ademakkus76@yahoo.com

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