Calculation of technological parameters of deposition process of carbon films on copper buffer layer
Keywords:
carbon films, buffer layer, sputtering coefficient, sputtering rate, evaporation rate.Abstract
In work calculations results of analytical dependences of technological parameters of deposition process of carbon films on copper buffer layer are presented, which allow to predict optimal concentration of hydrogen in a gas mix, intervals of working tension target-anode, thickness of deposited films and respectively time of experiments.References
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– fundamentals and applications, R. Gross et al. (eds), 2006, Springer, Netherlands. -P. 387-399.
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6 Sigmund P.. Theory of sputtering. I. Sputtering yield of amorphous and polycrystalline targets. – Physical Review, 1969, vol.
184, N 2. – P.. 383-416.
7 Pod red. R. Berisha. Raspyleniye tverdykh tel ionnoy bombardirovkoy. - M.: Mir, 1984, s. 233-234 (dlya medi), s. 223 (dlya
grafita).
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Мansurov B. Z., Мedyanova B. S., Mansurova, M. E., & Аliyev B. A. (2013). Calculation of technological parameters of deposition process of carbon films on copper buffer layer. Recent Contributions to Physics (Rec.Contr.Phys.), 46(3), 49–57. Retrieved from https://bph.kaznu.kz/index.php/zhuzhu/article/view/99
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Condensed Matter Physics and Materials Science Problems. NanoScience